IP Library Assignment 017196/0184
Patent Assignment
Reel/Frame 017196/0184

Assignment of Assignor's Interest

Recorded: 2006-02-20 Pages: 2
Assignor
ZAIDI, SHOAIB
Executed: 2006-01-27
Assignee
INFINEON TECHNOLOGIES NORTH AMERICA CORP.
1730 NORTH FIRST STREET, SAN JOSE, CALIFORNIA, 95112
Covered Property (1)
Semiconductor wafer having measurement area feature for determining dielectric layer thickness
Application: 11/343,052 →
Publication: US 2007/0178611
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 17, 2006
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 017479/0018 →
Assignment of Assignor's Interest Jan 13, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023773/0001 →