Patent Assignment
Reel/Frame 017246/0103
Assignment of Assignor's Interest
Recorded: 2006-02-08
Pages: 3
Assignors
KIYOHARA, MASAHIRO
Executed: 2005-12-21
SATO, MAKOTO
Executed: 2005-12-21
ASAHATA, TATSUYA
Executed: 2005-12-21
Assignee
SII NANO TECHNOLOGY INC.
8 NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method of Determining Processing Position in Charged Particle Beam Apparatus, and Infrared Microscope Used in the Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.