IP Library Assignment 017250/0728
Patent Assignment
Reel/Frame 017250/0728

Assignment of Assignor's Interest

Recorded: 2006-03-03 Pages: 2
Assignor
KANG, JUNG HO
Executed: 2006-02-28
Assignee
DONGBUANAM SEMICONDUCTOR INC.
891-10, DAECHI-DONG, GANGNAM-GU, SEOUL, 135-280, KOREA, REPUBLIC OF
Covered Property (1)
Composite Pattern for Monitoring Various Defects of Semiconductor Device
Patent: 7,306,958 →
Application: 11/324,168 →
Publication: US 2006/0145152
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 7, 2007
From: DONGBUANAM SEMICONDUCTOR INC.
To: DONGBU ELECTRONICS CO., LTD.
Reel/Frame 019800/0147 →