Patent Assignment
Reel/Frame 017311/0916
Assignment of Assignor's Interest
Recorded: 2006-03-02
Pages: 3
Assignors
MATSUMOTO, KATSUHIDE
Executed: 2006-02-23
SOUDA, MASAAKI
Executed: 2006-02-23
MITSUISHI, MASAFUMI
Executed: 2006-02-23
SAKAI, SHINGO
Executed: 2006-02-23
KATOU, HIROMU
Executed: 2006-02-23
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, JAPAN
Covered Property
(1)
Semiconductor Device with Test Circuit and Test Method of the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.