Patent Assignment
Reel/Frame 017352/0331
Assignment of Assignor's Interest
Recorded: 2005-12-12
Pages: 3
Assignor
HARABE, NOBUYUKI
Executed: 2005-11-17
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8582, JAPAN
Covered Property
(1)
Reference image forming apparatus, pattern inspection apparatus, and reference image forming method which use feature data
Application:
11/298,720 →
Publication:
US 2007/0052960
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.