Patent Assignment
Reel/Frame 019385/0760
Corporate Address Change
Recorded: 2007-06-05
Pages: 3
Assignor
ADVANCED MASK INSPECTION TECHNOLOGY INC.
Executed: 2007-03-24
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
8, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI, KANAGAWA, 235-0032, JAPAN
Covered Properties
(26)
Workpiece Inspection Apparatus Assisting Device, Workpiece Inspection Method and Computer-Readable Recording Media Storing Program Therefor
Die-To-Die Photomask Defect Detection Using Region Data to Modify Inspection Thresholds
Method of Operating Laser Light Source
Photomask Inspection Apparatus Comparing Optical Proximity Correction Patterns to Minimum and Maximum Limits
Die-To-Database Photomask Defect Detection Using Region Data to Modify Inspection Thresholds
Sample Inspection Apparatus, Image Alignment Method, and Program-Recorded Readable Recording Medium
Image correcting apparatus, pattern inspection apparatus, and image correcting method, and reticle
Application:
11/298,608 →
Publication:
US 2007/0053583
Reference image forming apparatus, pattern inspection apparatus, and reference image forming method which use feature data
Application:
11/298,720 →
Publication:
US 2007/0052960
Workpiece Inspection Apparatus, Workpiece Inspection Method and Computer-Readable Recording Medium Storing Program
Pattern Inspection Apparatus
Pattern inspection apparatus and method and reticle for use therein
Application:
11/304,664 →
Publication:
US 2007/0053578
Pattern inspection apparatus, pattern inspection method, and inspection sample
Application:
11/338,708 →
Publication:
US 2007/0064998
Light Amount Measurement Device and Light Amount Measurement Method
Pattern Inspection System Using Image Correction Scheme with Object-Sensitive Automatic Mode Switchability
Image Correcting Method
Image Correction Method
Pattern Inspection Method and Apparatus with High-Accuracy Pattern Image Correction Capability
Image Density-Adapted Automatic Mode Switchable Pattern Correction Scheme for Workpiece Inspection
Pattern Inspection Method and Apparatus Using Linear Predictive Model-Based Image Correction Technique
Pattern inspection apparatus and method along with workpiece tested thereby and management method of workpiece under testing
Application:
11/378,333 →
Publication:
US 2007/0146707
Pattern inspection apparatus and method and workpiece tested thereby
Application:
11/378,644 →
Publication:
US 2007/0165938
Pattern defect inspection method and apparatus using image correction technique
Application:
11/386,744 →
Publication:
US 2006/0222233
Pattern Inspection Apparatus and Method with Local Critical Dimension Error Detectability
Pattern Inspection Apparatus and Method with Enhanced Test Image Correctability Using Frequency Division Scheme
Image Correction Method and Apparatus for Use in Pattern Inspection System
Target Workpiece Inspection Apparatus, Image Alignment Method, and Computer-Readable Recording Medium with Program Recorded Thereon
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Nov 3, 2005
From: TSUJI, YOSHITAKE; SAITO, YASUKO; TSUCHIYA, HIDEO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017189/0963 →
Assignment of Assignor's Interest
Nov 22, 2005
From: ISOMURA, IKUNAO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017267/0806 →
Assignment of Assignor's Interest
Nov 22, 2005
From: ISOMURA, IKUNAO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017268/0242 →
Assignment of Assignor's Interest
Nov 28, 2005
From: YAMASHITA, KYOJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017292/0749 →
Assignment of Assignor's Interest
Dec 12, 2005
From: HARABE, NOBUYUKI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017360/0124 →
Assignment of Assignor's Interest
Dec 12, 2005
From: HARABE, NOBUYUKI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017352/0331 →
Assignment of Assignor's Interest
Dec 13, 2005
From: IMAI, SHINICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017361/0800 →
Assignment of Assignor's Interest
Dec 13, 2005
From: NAKATANI, YUICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017361/0793 →
Assignment of Assignor's Interest
Dec 16, 2005
From: HARABE, NOBUYUKI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017376/0959 →
Assignment of Assignor's Interest
Jan 25, 2006
From: UMEDA, TAKUO; MATSUMURA, KENICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017510/0710 →
Assignment of Assignor's Interest
Feb 1, 2006
From: KOBAYASHI, NOBORU; OGAWA, RIKI; HIDESHIMA, MASAYUKI; NAGAHAMA, HIROYUKI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.; KABUSHIKI KAISHA TOPCON
Reel/Frame 017524/0435 →
Assignment of Assignor's Interest
Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017616/0187 →
Assignment of Assignor's Interest
Feb 24, 2006
From: OAKI, JUNJI; HARABE, NOBUYUKI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017612/0762 →
Assignment of Assignor's Interest
Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017612/0826 →
Assignment of Assignor's Interest
Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI; NAKATANI, YUICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017616/0075 →
Assignment of Assignor's Interest
Feb 24, 2006
From: OAKI, JUNJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017616/0078 →
Assignment of Assignor's Interest
Mar 28, 2006
From: ISOMURA, IKUNAO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017724/0402 →
Assignment of Assignor's Interest
May 16, 2006
From: MATSUKI, KAZUTO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017900/0475 →
Corrective Assignment to Correct Assignee's Address Previously Recorded at Reel 017616 Frame 0078
Jun 2, 2006
From: OAKI, JUNJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017954/0741 →
Assignment of Assignor's Interest
Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest
Nov 11, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025348/0666 →
Assignment of Assignor's Interest
Sep 21, 2012
From: KABUSHIKI KAISHA TOPCON
To: NUFLARE TECHNOLOGY, INC.
Reel/Frame 029000/0022 →
Assignment of Assignor's Interest
Aug 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043482/0364 →
Assignment of Assignor's Interest
Jan 30, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 044763/0063 →
Assignment of Assignor's Interest
Apr 3, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045421/0052 →