Patent Assignment
Reel/Frame 017376/0959
Assignment of Assignor's Interest
Recorded: 2005-12-16
Pages: 3
Assignor
HARABE, NOBUYUKI
Executed: 2005-11-17
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA 212-8582, JAPAN
Covered Property
(1)
Pattern inspection apparatus and method and reticle for use therein
Application:
11/304,664 →
Publication:
US 2007/0053578
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.