IP Library Assignment 017612/0762
Patent Assignment
Reel/Frame 017612/0762

Assignment of Assignor's Interest

Recorded: 2006-02-24 Pages: 3
Assignors
OAKI, JUNJI
Executed: 2005-12-02
HARABE, NOBUYUKI
Executed: 2005-12-02
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY, INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8582, JAPAN
Covered Property (1)
Pattern Inspection Method and Apparatus with High-Accuracy Pattern Image Correction Capability
Patent: 7,627,164 →
Application: 11/360,657 →
Publication: US 2007/0064994
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Corporate Address Change Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
Assignment of Assignor's Interest Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest Apr 3, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045574/0652 →
Merger and Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →