IP Library › Assignment 045574/0652
Patent Assignment
Reel/Frame 045574/0652

Assignment of Assignor's Interest

Recorded: 2018-04-03 Pages: 4
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2018-03-16
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties (15)
Die-To-Die Photomask Defect Detection Using Region Data to Modify Inspection Thresholds
Patent: 7,630,535 →
Application: 11/276,426 →
Publication: US 2007/0071307
Die-To-Database Photomask Defect Detection Using Region Data to Modify Inspection Thresholds
Patent: 7,639,863 →
Application: 11/284,186 →
Publication: US 2007/0047799
Pattern Inspection System Using Image Correction Scheme with Object-Sensitive Automatic Mode Switchability
Patent: 7,487,491 →
Application: 11/360,580 →
Publication: US 2007/0064993
Image Correcting Method
Patent: 7,706,623 →
Application: 11/360,581 →
Publication: US 2006/0215899
Image Correction Method
Patent: 7,539,350 →
Application: 11/360,584 →
Publication: US 2006/0215900
Pattern Inspection Method and Apparatus with High-Accuracy Pattern Image Correction Capability
Patent: 7,627,164 →
Application: 11/360,657 →
Publication: US 2007/0064994
Image Density-Adapted Automatic Mode Switchable Pattern Correction Scheme for Workpiece Inspection
Patent: 7,565,032 →
Application: 11/360,679 →
Publication: US 2007/0064995
Pattern Inspection Method and Apparatus Using Linear Predictive Model-Based Image Correction Technique
Patent: 7,627,165 →
Application: 11/360,813 →
Publication: US 2007/0064996
Image Correction Method and Apparatus for Use in Pattern Inspection System
Patent: 7,796,803 →
Application: 11/567,550 →
Publication: US 2008/0050008
Target Workpiece Inspection Apparatus, Image Alignment Method, and Computer-Readable Recording Medium with Program Recorded Thereon
Patent: 7,655,904 →
Application: 11/678,748 →
Publication: US 2008/0036899
Pattern Inspection Apparatus, Image Alignment Method, Displacement Amount Estimation Method, and Computer-Readable Recording Medium with Program Recorded Thereon
Patent: 7,809,181 →
Application: 11/692,352 →
Publication: US 2008/0037860
Lighting Optical Apparatus and Sample Inspection Apparatus
Patent: 7,863,588 →
Application: 12/047,759 →
Publication: US 2008/0237489
Reticle Defect Inspection Apparatus and Inspection Method Using Thereof
Patent: 8,049,897 →
Application: 12/047,844 →
Publication: US 2008/0259328
Light Polarization Control Using Serial Combination of Surface-Segmented Half Wavelength Plates
Patent: 8,199,403 →
Application: 12/404,569 →
Publication: US 2009/0237909
Image Density-Adapted Automatic Mode Switchable Pattern Correction Scheme for Workpiece Inspection
Patent: 7,787,686 →
Application: 12/482,836 →
Publication: US 2009/0245619
Related Assignments (19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 22, 2005
From: ISOMURA, IKUNAO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017268/0242 →
Assignment of Assignor's Interest Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017616/0187 →
Assignment of Assignor's Interest Feb 24, 2006
From: OAKI, JUNJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017616/0078 →
Assignment of Assignor's Interest Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI; NAKATANI, YUICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017616/0075 →
Assignment of Assignor's Interest Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017612/0826 →
Assignment of Assignor's Interest Feb 24, 2006
From: OAKI, JUNJI; HARABE, NOBUYUKI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017612/0762 →
Assignment of Assignor's Interest Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI; NAKATANI, YUICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017610/0566 →
Assignment of Assignor's Interest Mar 28, 2006
From: ISOMURA, IKUNAO
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017724/0402 →
Corrective Assignment to Correct Assignee's Address Previously Recorded at Reel 017616 Frame 0078 Jun 2, 2006
From: OAKI, JUNJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 017954/0741 →
Assignment of Assignor's Interest Dec 6, 2006
From: OAKI, JUNJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 018592/0065 →
Assignment of Assignor's Interest Feb 26, 2007
From: YAMASHITA, KYOJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 018931/0230 →
Assignment of Assignor's Interest Mar 28, 2007
From: YAMASHITA, KYOJI
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019076/0293 →
Corporate Address Change Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
Assignment of Assignor's Interest Mar 13, 2008
From: HIRONO, MASATOSHI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 020647/0844 →
Assignment of Assignor's Interest Mar 13, 2008
From: HIRANO, RYOICHI; OGAWA, RIKI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 020648/0342 →
Assignment of Assignor's Interest May 14, 2009
From: OGAWA, RIKI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 022682/0733 →
Assignment of Assignor's Interest Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Merger and Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →