Patent Assignment
Reel/Frame 018592/0065
Assignment of Assignor's Interest
Recorded: 2006-12-06
Pages: 3
Assignor
OAKI, JUNJI
Executed: 2006-11-20
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8583, JAPAN
Covered Property
(1)
Image Correction Method and Apparatus for Use in Pattern Inspection System
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Corporate Address Change
Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
Assignment of Assignor's Interest
Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest
Apr 3, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045574/0652 →
Merger and Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →