Reticle defect inspection apparatus and inspection method using thereof
View Patent ↗A reticle defect inspection apparatus that suppresses deterioration of optical components resulting from luminescent spots generated by an integrator and can sustain a defect inspection with high precision for a long time is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on a reticle using a pattern image obtained by irradiating the reticle on which a pattern is formed with light. And the apparatus includes an illuminating optical system for irradiating the reticle with an inspection light and a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, wherein the illuminating optical system comprises an integrator for equalizing illumination distribution of the inspection light and a moving mechanism for enabling the integrator to slightly move in a direction perpendicular to an optical axis of the integrator.
1. A reticle defect inspection apparatus, comprising:
an illuminating optical system of reflected illumination for irradiating a reticle with an inspection light and
a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, the pattern image being formed by the inspection light reflected by the reticle, wherein
the illuminating optical system includes:
an integrator for equalizing illumination distribution of the inspection light; and
a moving mechanism for enabling the integrator to move in a direction perpendicular to an optical axis of the integrator,
wherein the moving mechanism is configured to move the integrator after a reticle defect inspection is repeated a plurality of times and when added irradiation time of inspection light exceeds a predetermined time.
2. The apparatus according to claim 1 , wherein the moving mechanism has a function to move the integrator in two directions perpendicular to each other.
3. The apparatus according to claim 1 , wherein the moving mechanism is configured to move the integrator so that the same luminescent spot position does not occur in an objective lens.
4. A reticle defect inspection apparatus, comprising:
an illuminating optical system of reflected illumination for irradiating a reticle with an inspection light, the pattern image being formed by the inspection light reflected by the reticle, and
a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, wherein
the illuminating optical system includes:
an integrator for equalizing illumination distribution of the inspection light;
an optically transparent optical path change plate provided on an optical path on a side of the reticle of the integrator; and
a moving mechanism for enabling the optical path change plate to tilt with respect to an optical axis of the integrator,
wherein the moving mechanism is configured to move the optical path change plate after a reticle defect inspection is repeated a plurality of times and when added irradiation time of inspection light exceeds a predetermined time.
5. The apparatus according to claim 4 , wherein the optical path change plate is a transparent quarts glass plate.
6. The apparatus according to claim 4 , wherein the moving mechanism is configured to move the optical path change plate so that the same luminescent spot position does not occur in an objective lens.
7. An inspection method using a reticle defect inspection apparatus, wherein
the reticle defect inspection apparatus comprises:
an illuminating optical system of reflected illumination for irradiating the reticle with an inspection light; and
a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, the pattern image being formed by the inspection light reflected by the reticle,
the illuminating optical system includes:
an integrator for equalizing illumination distribution of the inspection light; and
a moving mechanism for enabling the integrator to slightly move in a direction perpendicular to an optical axis of the integrator, and
the integrator is moved in the direction perpendicular to the optical axis of the integrator after a plurality of reticle defect inspections have been performed and if added irradiation time of inspection light exceeds a predetermined time.
8. The method according to claim 7 , wherein after the integrator is moved, the reticle defect inspection is further continued to repeat the movement of the integrator, the integrator is moved in a random direction and by a random distance for each time of the movement.