IP Library › Assignment 020648/0342
Patent Assignment
Reel/Frame 020648/0342

Assignment of Assignor's Interest

Recorded: 2008-03-13 Pages: 3
Assignors
HIRANO, RYOICHI
Executed: 2008-02-27
OGAWA, RIKI
Executed: 2008-02-27
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY, INC.
8, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI, KANAGAWA, 235-0032, JAPAN
Covered Property (1)
Reticle Defect Inspection Apparatus and Inspection Method Using Thereof
Patent: 8,049,897 →
Application: 12/047,844 →
Publication: US 2008/0259328
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest Apr 3, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045574/0652 →
Merger and Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →