IP Library Granted Patent US 7,539,350
Granted Patent B2
US 7,539,350 · App. 11/360,584 · Granted May 26, 2009

Image correction method

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Quick Facts
Patent No.
US 7,539,350
App. No.
11/360,584
Granted
May 26, 2009
Kind
B2
Abstract

An image correction method having a small number of setting parameters achieved by integrating shift (alignment) in unit of a sub-pixel and image correction. A relationship between an inspection reference pattern image and a pattern image under test is identified, a mathematical expression model which fits a pixel error, expansion and contraction/distortion noise, and sensing noise of the image is constructed, and the model is simulated to generate an estimation model image.

Claims (18)

1. An image correction method for generating an estimation model image from an inspection reference pattern image and a pattern image under test, said method comprising:

setting reference points at a plurality of separated positions of the inspection reference pattern image, giving weights to the inspection reference pattern image with reference to the reference points, and generating decomposed images the number of which is equal to the number of reference points;

generating simultaneous equations which describe an input-output relationship using a linear prediction model using, as an output, respective pixels of the pattern image under test and using, as an input, a linear coupling of a pixel group around pixel corresponding to each pixel of the decomposed images the number of which is equal to the number of reference points;

solving the simultaneous equations to estimate parameters of the prediction model; and

generating an estimation model image by using the estimated parameters.

2. The image correction method according to claim 1 , wherein

the linear prediction model is a two-dimensional prediction model using each pixel of the pattern image under test as two-dimensional output data and using a linear coupling of a pixel group around each pixel as two-dimensional input data.

3. The image correction method according to claim 1 , wherein

the parameters of the prediction model are estimated by using the least-square method.

4. The image correction method according to claim 1 , wherein

the reference points are apexes of the inspection reference pattern image or point near the apexes.

5. The image correction method according to claim 1 , wherein

the pixel group around the corresponding pixel is a pixel group of a 5×5 matrix arranged around the corresponding pixel.

6. The image correction method according to claim 1 , wherein

the linear coupling is performed by linear interpolation with respect to decomposed images the number of which is equal to the number of reference points.

7. The image correction method according to claim 1 , comprising

dividing the inspection reference pattern image and the pattern image under test into plurality of regions, respectively, before the decomposed image generating step, and wherein

parameters of the prediction model are estimated with respect to the divided images to generate an estimation model image.

Assignments (6)
MERGER AND CHANGE OF NAME Recorded Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
CHANGE OF NAME Recorded Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045574/0652 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
CORPORATE ADDRESS CHANGE Recorded Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 24, 2006
From: OAKI, JUNJI; SUGIHARA, SHINJI; NAKATANI, YUICHI
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 017616/0075 →