Patent Assignment
Reel/Frame 017524/0435
Assignment of Assignor's Interest
Recorded: 2006-02-01
Pages: 3
Assignors
KOBAYASHI, NOBORU
Executed: 2005-12-20
OGAWA, RIKI
Executed: 2005-12-20
HIDESHIMA, MASAYUKI
Executed: 2006-01-18
NAGAHAMA, HIROYUKI
Executed: 2006-01-19
NAKAJIMA, KOJI
Executed: 2006-01-18
Assignees
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8582, JAPAN
KABUSHIKI KAISHA TOPCON
75-1, HASUNUMA-CHO, ITABASHI-KU, TOKYO 174-8580, JAPAN
Covered Property
(1)
Light Amount Measurement Device and Light Amount Measurement Method
Related Assignments
(6)
Other recorded transfers of the patent in this record — the chain of ownership.
Corporate Address Change
Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
Assignment of Assignor's Interest
Nov 11, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025348/0666 →
Assignment of Assignor's Interest
Sep 21, 2012
From: KABUSHIKI KAISHA TOPCON
To: NUFLARE TECHNOLOGY, INC.
Reel/Frame 029000/0022 →
Assignment of Assignor's Interest
Apr 3, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045421/0052 →
Merger and Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name
Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →