IP Library Assignment 017292/0749
Patent Assignment
Reel/Frame 017292/0749

Assignment of Assignor's Interest

Recorded: 2005-11-28 Pages: 3
Assignor
YAMASHITA, KYOJI
Executed: 2005-10-24
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA 212-8582, JAPAN
Covered Property (1)
Sample Inspection Apparatus, Image Alignment Method, and Program-Recorded Readable Recording Medium
Patent: 7,577,288 →
Application: 11/287,419 →
Publication: US 2007/0053582
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Corporate Address Change Jun 5, 2007
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: ADVANCED MASK INSPECTION TECHNOLOGY INC.
Reel/Frame 019385/0760 →
Assignment of Assignor's Interest Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
Assignment of Assignor's Interest Aug 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043482/0364 →
Merger and Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 057224/0091 →
Change of Name Aug 19, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 057224/0641 →