Patent Assignment
Reel/Frame 017510/0710
Assignment of Assignor's Interest
Recorded: 2006-01-25
Pages: 3
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8582, JAPAN
Covered Property
(1)
Pattern inspection apparatus, pattern inspection method, and inspection sample
Application:
11/338,708 →
Publication:
US 2007/0064998
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.