Patent Assignment
Reel/Frame 017357/0937
Assignment of Assignor's Interest
Recorded: 2006-03-20
Pages: 3
Assignor
ASAKA, TOSHIHARU
Executed: 2006-01-31
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit with Delay Test Circuit, and Method for Testing Semiconductor Integrated Circuit
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.