Patent Assignment
Reel/Frame 025311/0815
Change of Name
Recorded: 2010-11-04
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Semiconductor Device Having an Inspection Hole Striding a Boundary
Schmidt Trigger Circuit Having Sensitivity Adjusting Function and Semiconductor Device Including the Same
Methods for Designing, Evaluating and Manufacturing Semiconductor Devices
Semiconductor Integrated Circuit, Layout Method, Layout Apparatus and Layout Program
Semiconductor Device with Multiple Interconnect Layers and Vias
Semiconductor Apparatus Having a Column Region with Differing Impurity Concentrations
Semiconductor Device
Memory Cell and Semiconductor Integrated Circuit Device
Semiconductor Memory Device
Flip-Chip Semiconductor Device with Improved Power Pad Arrangement
Semiconductor Device
Semiconductor Device Including Multiple Rows of Peripheral Circuit Units
Error Detection Apparatus and Method and Signal Extractor
Semiconductor Device
Usb Hub, Usb-Compliant Apparatus, and Communication System
Semiconductor Memory Device Having Reduced Leakage Current
Reference Voltage Circuit
Filter Circuit
Semiconductor Device Having Analog and Digital Circuits
Micro Computer and Method of Optimizing Microcomputer
Circuit Board and Semiconductor Device
Interconnecting Substrate and Semiconductor Device
Gain Variable Amplifier
Data Multiplexing Apparatus
Semiconductor Device Design System and Method, and Software Product for the Same
Semiconductor Device and Manufacturing Process Therefor
Semiconductor Memory Apparatus
Semiconductor Integrated Circuit Device Comprising Sram and Capacitors
Thin Planar Semiconductor Device Having Electrodes on Both Surfaces and Method of Fabricating Same
Communication System, Communication Circuit and Communication Method
Semiconductor Chip and Method of Fabricating the Same
Method for Manufacturing a Semiconductor Protection Element and a Semiconductor Device
Semiconductor Device with Dram Portion Having Capacitor-Over-Bit-Line Structure and Logic Portion
Noise Measuring System, Noise Measuring Method, and Semiconductor Device
Charging Control Circuit and Charging Device Including Charging Transistor Control Unit
Method, Apparatus and Program for Automatically Routing Semiconductor Integrated Circuit
Semiconductor Integrated Circuit with Delay Test Circuit, and Method for Testing Semiconductor Integrated Circuit
Operational Amplifier Circuit
Interface Circuit
Passive Type Rfid Semiconductor Device, Ic Tag, and Control Method
Pull-down detection apparatus and pull-down detection method
Application:
11/349,904 →
Publication:
US 2006/0187301
Disk Reproducing Apparatus and Method
Semiconductor Device Including Fuse and Method for Testing the Same Capable of Suppressing Erroneous Determination
A Semiconductor device having bonding pad of the first chip thicker than bonding pad of the second chip
Pull-Down Detection Apparatus and Pull-Down Detection Method
Pull-Down Detection Apparatus and Pull-Down Detection Method
Gray Scale Voltage Generating Circuit
Semiconductor Device
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Integrated Circuit for Reducing Number of Contact Pads to Be Probed in Probe Test
Edram-Type Semiconductor Device Including Logic Circuit Section Featuring Large Capacitance Capacitor, and Capacitor Dram Section Featuring Small Capacitance Capacitor
Length Measurement Pattern, Semiconductor Device, and Method of Manufacturing a Semiconductor Device
Semicondutor Device
Semiconductor Integrated Circuit and Method of Tesiting Semiconductor Integrated Circuit
Semiconductor Device
Manufacturing Method of Semiconductor Device
Semiconductor Device Having an Interconnect Structure and a Reinforcing Insulating Film
Computer System and Control Method of the Same
Data Transfer Control Device, Image Processing Device, and Data Transfer Control Method
Semiconductor Storage Device and Operating Method Therefor
Semiconductor Device and Manufacturing Process Therefor
An Soi Semiconductor Device Including a Gurad Ring Region
Display Control Circuit
Low Amplitude Differential Output Circuit and Serial Transmission Interface Using the Same
Semiconductor Chip and Semiconductor Device Including the Same
Method for Manufacturing Flip-Chip Type Semiconductor Device Featuring Nickel Electrode Pads, and Plating Apparatus Used in Such Method
Semiconductor Device and Manufacturing Method for Semiconductor Device
Method of Manufacturing Semiconductor Device
Scrambler Circuit, Encoding Device, Encoding Method and Recording Apparatus
Method of Fabricating a Non-Volatile Memory Element Including Nitriding and Oxidation of an Insulating Film
Semiconductor Chip
Method for Manufacturing Semiconductor Device to Form a via Hole
Semiconductor Integrated Circuit Device and Inspection Method of the Same
Multiport Memory Device
Driver circuit of display device
Application:
11/370,862 →
Publication:
US 2006/0152453
Semiconductor Integrated Circuit Device, and Apparatus and Program for Designing Same
Method and Apparatus for Detecting Abnormal Characteristic Values Capable of Suppressing Detection of Normal Characteristic Values
Semiconductor Device Featuring Overlay-Mark Used in Photolithography Process
Semiconductor Device
Positioning Apparatus and Positioning Method
Pattern Forming Method, Semiconductor Device Manufacturing Method and Phase Shift Photomask Having Dummy Gate Patterns
Inspection Method and Apparatus Using Scanning Laser Squid Microscope
Video Encoder and Decoder for Achieving Inter-and Intra-Frame Predictions with Reduced Memory Resource
Non-Volatile Memory and Method for Manufacturing Non-Volatile Memory
Impedance Measuring Apparatus of Package Substrate and Method for the Same
Semiconductor Device Having Flash Memory with a Data Length Table
Mos Semiconductor Device with Low on Resistance
Nonvolatile Semiconductor Memory
Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values
Application:
11/378,297 →
Publication:
US 2006/0224267
Field-Effect Transistor Comprising Hollow Cavity
Semiconductor Device
Semi-Custom-Made Semiconductor Integrated Circuit Device, Method for Customization and Method for Redesign
Related Assignments
(1)
Other recorded transfers of the patents in this record — the chain of ownership.