IP Library Granted Patent US 7,433,793
Granted Patent B2
US 7,433,793 · App. 11/334,371 · Granted Oct 7, 2008

Error detection apparatus and method and signal extractor

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Quick Facts
Patent No.
US 7,433,793
App. No.
11/334,371
Granted
Oct 7, 2008
Kind
B2
Abstract

A modulated voltage signal modulated at a predetermined frequency f 0 is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal containing information on power supply current flowing through the integrated circuit under test at the stationary point. Then, a determination signal from which DC component is removed is extracted from the observation signal and supplied to a determination device. The determination device compares the size of spectral component of the determination signal at the predetermined frequency f 0 between each measurement point and determines that an error exists in the integrated circuit under test if a difference is a predetermined value or greater.

Claims (41)

1. An error detection method comprising:

setting an integrated circuit to be tested to a stationary point wherein the integrated circuit comprises at least one inverter and wherein the at least one inverter is fixed to high or low;

supplying a voltage signal modulated at a predetermined frequency to the integrated circuit;

generating an observation signal containing information on power supply current flowing through the integrated circuit at the stationary point;

extracting a determination signal from the observation signal; and

detecting leak current and determining presence or absence of an error in the integrated circuit based on a size of spectral component of the determination signal at the predetermined frequency.

2. The error detection method according to claim 1 , wherein the determination of the presence or absence of an error in the integrated circuit under test is performed based on a difference in size of the spectral component at a plurality of stationary points.

3. The error detection method according to claim 1 , wherein the determination of the presence or absence of an error in the integrated circuit under test is performed based on a comparison result between a size of the spectral component at a plurality of stationary points and a reference value.

4. The error detection method according to claim 3 , wherein the reference value is a size of the spectral component in a reference integrated circuit determined to be nondefective.

5. The error detection method according to claim 1 wherein the extraction of the determination signal removes DC component from the observation signal generated by converting power supply current flowing through the integrated circuit under test at the stationary point into a voltage and superposing the voltage onto the modulated voltage signal.

6. The error detection method according to claim 1 , wherein the extraction of the determination signal calculates a differential signal between the observation signal generated by converting power supply current flowing through the integrated circuit under test at the stationary point into a voltage and superposing the voltage onto the modulated voltage signal and a DC signal after removing AC component from the modulated voltage signal, and removes DC component from the differential signal.

7. A signal extraction circuit comprising:

a power supply generator supplying a modulated voltage signal modulated at a predetermined frequency to an integrated circuit to be tested, wherein the integrated circuit is set at a stationary point and the integrated circuit comprises at least one inverter and wherein the at least one inverter is fixed to high or low; and

a determination signal extractor extracting a determination signal from an observation signal containing information on power supply current flowing through the integrated circuit at the stationary point and supplying the determination signal to a determination device which detects a leak current and determines presence or absence of an error in the integrated circuit based on a size of spectral component of the determination signal at the predetermined frequency.

8. The signal extraction circuit according to claim 7 , wherein the determination signal extractor comprises:

an observation signal generator generating the observation signal by converting power supply current flowing through the integrated circuit under test at the stationary point into a voltage and superposing the voltage onto the modulated voltage signal; and

a DC component remover removing DC component from the observation signal and outputting the determination signal.

9. The signal extraction circuit according to claim 7 , wherein the determination signal extractor comprises:

an observation signal generator generating the observation signal by converting power supply current flowing through the integrated circuit under test at the stationary point into a voltage and superposing the voltage onto the modulated voltage signal;

an AC component remover removing AC component from the modulated voltage signal;

a differential signal generator outputting a differential signal between the observation signal and a DC signal from the AC component remover; and

a determination signal output portion removing DC component from the differential signal and outputting the determination signal.

10. An error detection apparatus comprising:

a stationary point setting portion setting an integrated circuit to be tested at a stationary point, wherein the integrated circuit comprises at least one inverter and wherein the at least one inverter is fixed to high or low;

a power supply generator supplying a modulated voltage signal modulated at a predetermined frequency to the integrated circuit under test set at the stationary point;

a determination signal extractor extracting a determination signal from an observation signal containing information on power supply current flowing through the integrated circuit at the stationary point; and

a determinator which detects leak current and determines presence or absence of an error in the integrated circuit based on a size of spectral component of the determination signal at the predetermined frequency.

11. The error detection apparatus according to claim 10 , wherein the determinator determines the presence or absence of an error in the integrated circuit under test based on a difference in size of the spectral component at a plurality of stationary points.

12. The error detection apparatus according to claim 10 , wherein the determinator determines the presence or absence of an error in the integrated circuit under test based on a comparison result between a size of the spectral component at a plurality of stationary points and a reference value.

13. The error detection apparatus according to claim 12 , wherein the reference value is a size of the spectral component in a reference integrated circuit determined to be nondefective.

14. The error detection apparatus according to claim 10 , wherein the determinator performs Fourier transform on the determination signal, extracts a size of the spectral component at the predetermined frequency, and determines presence or absence of an error in the integrated circuit under test based on the extracted size of the spectral component.

15. The error detection apparatus according to claim 11 , wherein the determinator performs Fourier transform on the determination signal, extracts a size of the spectral component at the predetermined frequency, and determines presence or absence of an error in the integrated circuit under test based on the extracted size of the spectral component.

16. The error detection apparatus according to claim 12 , wherein the determinator performs Fourier transform on the determination signal, extracts a size of the spectral component at the predetermined frequency, and determines presence or absence of an error in the integrated circuit under test based on the extracted size of the spectral component.

17. The error detection apparatus according to claim 10 , wherein the power supply generator comprises a power supply and a modulator superposing a sinusoidal wave at the predetermined frequency onto a voltage from the power supply.

18. The error detection apparatus according to claim 11 , wherein the power supply generator comprises a power supply and a modulator superposing a sinusoidal wave at the predetermined frequency onto a voltage from the power supply.

19. The error detection apparatus according to claim 12 , wherein the power supply generator comprises a power supply and a modulator superposing a sinusoidal wave at the predetermined frequency onto a voltage from the power supply.

20. The error detection apparatus according to claim 13 , wherein the power supply generator comprises a power supply and a modulator superposing a sinusoidal wave at the predetermined frequency onto a voltage from the power supply.

21. The error detection method according to claim 1 , wherein the presence or absence of an error in the integrated circuit is automatically determined by a computing unit.

22. The error detection method according to claim 1 , further comprising removing DC component from the observation signal.

23. The signal extraction circuit according to claim 7 , wherein the determination signal extractor removes DC component from the observation signal.

24. The error detection apparatus according to claim 10 , wherein the determination signal extractor removes DC component from the observation signal.

Assignments (2)
CHANGE OF NAME Recorded Nov 4, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025311/0815 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2006
From: MORI, KENJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 017490/0937 →