IP Library Assignment 017390/0039
Patent Assignment
Reel/Frame 017390/0039

Assignment of Assignor's Interest

Recorded: 2005-12-20 Pages: 2
Assignor
MAZNEV, ALEXEI
Executed: 2004-06-03
Assignee
KONINKLIJKE PHILIPS ELECTRONICS, N.V.
GROENENWOUDSEWEG 1, EINDHOVEN, THE, 5621 BA, NETHERLANDS
Covered Property (1)
Method of Measuring Sub-Micron Trench Structures
Patent: 7,499,183 →
Application: 10/561,467 →
Publication: US 2008/0123080
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 13, 2007
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: ADVANCED METROLOGY SYSTEMS LLC
Reel/Frame 019683/0657 →