IP Library › Assignment 017402/0085
Patent Assignment
Reel/Frame 017402/0085

Assignment of Assignor's Interest

Recorded: 2006-01-03 Pages: 3
Assignors
YAMAGUCHI, ATSUKO
Executed: 2005-12-22
FUKUDA, HIROSHI
Executed: 2005-12-22
KOMURO, OSAMU
Executed: 2005-12-23
KAWADA, HIROKI
Executed: 2005-12-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
High-Accuracy Pattern Shape Evaluating Method and Apparatus
Patent: 7,230,723 →
Application: 11/322,559 →
Publication: US 2006/0145076
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →