Patent Assignment
Reel/Frame 017415/0650
Assignment of Assignor's Interest
Recorded: 2005-12-22
Pages: 3
Assignors
MURAKAMI, KIYOSHI
Executed: 2005-12-16
ISHIBA, MASATO
Executed: 2005-12-16
YOTSUYA, TERUHISA
Executed: 2005-12-16
Assignee
OMRON CORPORATION
801 MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRU, SHIOKOJI-DORI, SHIMOGYO-KU, KYOTO 600-8530, JAPAN
Covered Property
(1)
Image Processing Method, Substrate Inspection Method, Substrate Inspection Apparatus and Method of Generating Substrate Inspection Data