Patent Assignment
Reel/Frame 017415/0936
Assignment of Assignor's Interest
Recorded: 2006-01-04
Pages: 3
Assignor
IKKU, YUTAKA
Executed: 2005-11-17
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Pattern Measuring Method and Measuring System Using Display Microscope Image
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.