Patent Assignment
Reel/Frame 017429/0613
Assignment of Assignor's Interest
Recorded: 2005-12-30
Pages: 3
Assignor
JANG, CHANG SOO
Executed: 2005-12-26
Assignee
DONGBUANAM SEMICONDUCTOR INC.
891-10, DAECHI-DONG, GANGNAM-GU, SEOUL 135-280, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Automatic Measurement of Failure in Subthreshold Region of Metal-Oxide-Semiconductor Transistor
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.