IP Library Assignment 017527/0255
Patent Assignment
Reel/Frame 017527/0255

Corrective Assignment to Correct the the State in the Address of the New Assignee Should Be Colorado Previously Recorded on Reel 017519 Frame 0904. Assignor(S) Hereby Confirms the on the Original the State in the Address Was Listed as Ohio.

Recorded: 2006-04-26 Pages: 14
Assignor
Assignee
AGILENT TECHNOLOGIES, INC.
815 SW 14TH STREET, ATTN: SUE HEBERT DM 525, LOVELAND, COLORADO, 80537
Covered Properties (33)
Cell and Substrate for Electrochemical Stm Studies
Patent: 4,868,396 →
Application: 07/108,156 →
Potentiostatic Preparation of Molecular Adsorbates for Scanning Probe Microscopy
Patent: 5,155,361 →
Application: 07/736,095 →
Novel Stationary-Sample Stage Atomic Force Microscope with Beam-Tracking Lens and S-Shaped Scanner
Patent: 5,440,920 →
Application: 08/190,948 →
Controlled Force Microscope for Operation in Liquids
Patent: 5,515,719 →
Application: 08/246,035 →
Potentiostatic Preparation of Molecular Adsorbates for Scanning Probe Microscopy
Patent: 35,317 →
Application: 08/321,649 →
Scanning Probe Microscope for Use in Fluids
Patent: 5,750,989 →
Application: 08/388,068 →
Electrochemical Identification of Molecules in a Scanning Probe Miroscope
Patent: 5,495,109 →
Application: 08/399,968 →
Stress Cell for a Scanning Probe Microscope
Patent: 5,500,535 →
Application: 08/399,969 →
Magnetic Modulation of Force Sensor for Ac Detection in an Atomic Force Microscope
Patent: 5,513,518 →
Application: 08/403,238 →
Atomic Force Microscope Employing Beam Tracking
Patent: 5,587,523 →
Application: 08/427,353 →
Microscope for Force and Tunneling Microscopy in Liquids
Patent: 5,621,210 →
Application: 08/485,497 →
Tip Etching System and Method for Etching Platinum-Containing Wire
Patent: 5,630,932 →
Application: 08/524,054 →
Variable Temperature Scanning Probe Microscope Based on a Peltier Device
Patent: 5,654,546 →
Application: 08/551,836 →
Formation of a Magnetic Film on an Atomic Force Microscope Cantilever
Patent: 5,612,491 →
Application: 08/553,111 →
Scanning Probe Microscope
Patent: 5,675,154 →
Application: 08/653,200 →
Cantilevers for a Magnetically Driven Atomic Force Microscope
Patent: 5,866,805 →
Application: 08/710,191 →
Atomic Force Microscope Employing Beam-Tracking
Patent: 5,763,767 →
Application: 08/717,767 →
Magnetically-Oscillated Probe Microscope for Operation in Liquids
Patent: 5,753,814 →
Application: 08/722,344 →
Heated Stage for Ascanning Probe Microscope
Patent: 5,821,545 →
Application: 08/729,395 →
Tips and Substrates for Scanning Probe Microscopy
Patent: 6,017,590 →
Application: 08/760,757 →
Hybrid Control System for Scanning Probe Microscopes
Patent: 5,805,448 →
Application: 08/805,030 →
Scanning Probe Microscope
Patent: 5,760,396 →
Application: 08/874,440 →
Microscope for Compliance Measurement
Patent: 5,983,712 →
Application: 08/905,815 →
Force Sensing Probe for Scanning Probe Microscopy
Patent: 6,121,611 →
Application: 09/082,095 →
Conducting Scanning Probe Microscope with Environmental Control
Patent: 6,051,825 →
Application: 09/100,049 →
Magnetic Modulation of Force Sensor for Ac Detection in an Atomic Force Microscope
Patent: 6,134,955 →
Application: 09/228,226 →
Vibrating Tip Conducting Probe Microscope
Patent: 6,245,204 →
Application: 09/273,634 →
Scanning Probe Microscope and Solenoid Driven Cantilever Assembly
Patent: 6,734,438 →
Application: 09/882,465 →
Pendulum Scanner for Scanning Probe Microscope
Patent: 6,748,795 →
Application: 10/205,778 →
Topography and Recognition Imaging Atomic Force Microscope and Method of Operation
Patent: 6,952,952 →
Application: 10/697,841 →
Publication: US 2004/0129064
Fast Scanning Stage for a Scanning Probe Microscope
Patent: 7,687,767 →
Application: 10/725,769 →
Publication: US 2004/0129873
Topography and Recognition Imaging Atomic Force Microscope and Method of Operation
Patent: 7,152,462 →
Application: 11/152,827 →
Publication: US 2006/0016251
Crosslinker compositions for use as chemical and biological sensors
Application: 60/650,285 →
Related Assignments (10)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 12, 1996
From: HAN, WENHAI; JING, TIANWEI; LINDSAY, STUART M.
To: MOLECULAR IMAGING CORPORATION
Reel/Frame 008218/0765 →
Confirmatory License Nov 29, 2005
From: ARIZONA STATE UNIVERSITY
To: ARIZONA STATE UNIVERSITY
Reel/Frame 016824/0061 →
Confirmatory License Nov 29, 2005
From: ARIZONA STATE UNIVERSITY
To: ARIZONA STATE UNIVERSITY
Reel/Frame 016824/0063 →
Confirmatory License Dec 8, 2005
From: ARIZONA STATE UNIVERSITY
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 016862/0488 →
Confirmatory License Dec 8, 2005
From: ARIZONA STATE UNIVERSITY
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 016862/0645 →
Change of Name Apr 25, 2006
From: MOLECULAR IMAGING CORP
To: AGILENT TECHNOLOGIES, INC.; MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC.
Reel/Frame 017519/0904 →
Corrective Assignment to Correct the Assignee Name Correction: Molecular Imagining Corp., a Wholley Owned Subsidiary of Agilent Technologies, Inc. Previously Recorded on Reel 017527 Frame 0255. Assignor(S) Hereby Confirms the Original Assignee Name Listed as Agilent Technologies, Inc.. Apr 27, 2006
From: MOLECULAR IMAGING CORP
To: MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC.
Reel/Frame 017537/0032 →
Assignment of Assignor's Interest Sep 16, 2014
From: AGILENT TECHNOLOGIES, INC.
To: KEYSIGHT TECHNOLOGIES, INC.
Reel/Frame 033746/0714 →
Assignment of Assignor's Interest May 14, 2015
From: AGILENT TECHNOLOGIES, INC.
To: KEYSIGHT TECHNOLOGIES, INC.
Reel/Frame 035635/0130 →
Assignment of Assignor's Interest Feb 15, 2023
From: MATHEY, MEGAN M.
To: SPRING MEADOW NURSERY, INC
Reel/Frame 062708/0656 →