Topography and recognition imaging atomic force microscope and method of operation
View Patent ↗A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
1. A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface comprising,
a scanning probe having a tip that has been sensitized with a sensing agent to a property of said surface, said sensing agent bound to said tip by a flexible tether, said probe adapted to oscillate with a low mechanical Q factor;
means for measuring and recording changes in peak displacement of the probe tip as a function of time comprising,
a source of radiation directed at said probe;
a position sensitive detector for detecting radiation reflected from said probe; and
a processor for processing signals from said detector to determine both topographic images and the spatial location of interactions between said probe and sensed agents on said surface, including means for measuring and recording the amplitude of the upward swing and the amplitude of the downward swing of said probe tip.
2. A microscope as claimed in claim 1 where the Q factor is 20 or less.
3. A microscope as claimed in claim 1 wherein the probe tip is sensitized with a sensing agent that binds specifically to the sensed agent.
4. A microscope as claimed in claim 3 wherein said sensing agent is an antibody.