IP Library › Assignment 017530/0433
Patent Assignment
Reel/Frame 017530/0433

Assignment of Assignor's Interest

Recorded: 2006-02-01 Pages: 3
Assignors
IGARASHI, HISAO
Executed: 2005-11-30
SATO, KATSUMI
Executed: 2005-11-30
INOUE, KAZUO
Executed: 2005-11-30
Assignee
JSR CORPORATION
6-10, TSUKIJI 5-CHOME, CHUO-KU, TOKYO 104-0045, JAPAN
Covered Property (1)
Anisotropic Conductive Connector and Wafer Inspection Device
Patent: 7,384,279 →
Application: 10/559,846 →
Publication: US 2006/0154500
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 14, 2006
From: FINK, MATHIAS; LEROSEY, GEOFFROY; DERODE, ARNAUD; DE ROSNY, JULIEN
To: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE-CNRS; UNIVERSITE PARIS 7 - DENIS DIDEROT
Reel/Frame 018517/0296 →
Assignment of Assignor's Interest Jul 11, 2014
From: JSR CORPORATION
To: ISC CO., LTD.
Reel/Frame 033301/0837 →
Merger Aug 25, 2023
From: UNIVERSITE PARIS DIDEROT-PARIS 7; UNIVERSITE PARIS DESCARTES
To: UNIVERSITE DE PARIS
Reel/Frame 064702/0827 →
Change of Name Aug 25, 2023
From: UNIVERSITE DE PARIS
To: UNIVERSITÉ PARIS CITÉ
Reel/Frame 064727/0194 →