Patent Assignment
Reel/Frame 033301/0837
Assignment of Assignor's Interest
Recorded: 2014-07-11
Pages: 5
Assignor
JSR CORPORATION
Executed: 2014-06-11
Assignee
ISC CO., LTD.
6F., 215, GALMACHI-RO, JUNGWON-GU, SEONGNAM-SI, GYEONGGI-DO, 462-120, KOREA, REPUBLIC OF
Covered Properties
(51)
Process and Apparatus for Manufacturing an Anisotropic Conductor Sheet and a Magnetic Mold Piece for the Same
Patent:
6,103,359 →
Application:
08/859,031 →
Inspection Jig
Patent:
6,097,198 →
Application:
09/002,915 →
Anisotropic Conductivity Sheet with Positioning Portion
Patent:
6,168,442 →
Application:
09/218,159 →
Inspection Adapter Board for Printed Board, Method for Inspecting Printed Board, and Method and Apparatus for Producing Information for Fabricating the Inspection Adapter Board
Patent:
6,194,906 →
Application:
09/333,668 →
Electric resistance measuring apparatus and method for circuit board
Patent:
6,297,652 →
Application:
09/510,673 →
Anisotropically Conductive Sheet, Production Process Thereof and Connector
Patent:
6,690,564 →
Application:
09/662,122 →
Anisotropically Conductive Sheet and Connector
Anisotropically Conductive Sheet, Production Process Thereof and Applied Product Thereof
Conductive Metal Particles, Conductive Composite Metal Particles and Applied Products Using the Same
Anisotropic Conductive Sheet
Electric Resistance Measuring Connector and Measuring Device and Measuring Method for Circuit Board Electric Resistance
Anisotropic Conductive Sheet and Wafer Inspection Device
Anisotropically conductive connector and production process thereof, and probe member
Patent:
6,969,622 →
Application:
10/470,746 →
Plural Layer Anisotropic Conductive Connector and Its Production Method
Connector for Measuring Electric Resistance, Apparatus and Method for Measuring Electric Resistance of Circuit Board
Sheet-Form Connector and Production Method and Application Therefor
Anisotropic Conductivity Connector, Conductive Paste Composition, Probe Member, and Wafer Inspection Device, and Wafer Inspecting Method
Anisotropic Conductivity Connector, Probe Member, Wafer Inspecting Device, and Wafer Inspecting Method
Anisotropic Conductivity Connector, Conductive Paste Composition, Probe Member, and Wafer Inspection Device, and Wafer Inspecting Method
Anisotropic, Conductive Sheet and Impedance Measuring Probe
Anisotropic Conductive Sheet, Its Manufacturing Method, and Its Application
Anisotropic Conductive Connector and Production Method Therefor and Inspection Unit for Circuit Device
Circuit Board Checker and Circuit Board Checking Method
Anisotropic Conductive Connector, Conductive Paste Composition, Probe Member, Wafer Inspection Device and Wafer Inspection Method
Anisotropic Conductive Connector and Circuit-Device Electrical Inspection Device
Sheet-Like Probe, Process for Producing the Same and Its Application
Anisotropic Conductive Connector and Wafer Inspection Device
Anisotropic Conductive Connector Device and Production Method Therefor and Circuit Device Inspection Device
Adapter for Circuit Board Examination and Device for Circuit Board Examination
Probe Apparatus,Wafer Inspecting Apparatus Provided with the Probe Apparatus and Wafer Inspecting Method
Anisotropically Conductive Sheet, Production Process Thereof and Connector
Conductive Metal Particles, Conductive Composite Metal Particles and Applied Products Using the Same
Anisotropically Conductive Connector and Production Process Thereof, and Probe Member
Inspection Contact Structure and Probe Card
Anisotropic Conductive Connector and Inspection Equipment for Circuit Device
Sheet-Like Probe, Method of Producing the Probe, and Application of the Probe
Sheet-Like Probe, Method of Producing the Probe, and Application of the Probe
Inspection Equipment of Circuit Board and Inspection Method of Circuit Board
Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection Apparatus
Circuit Board Checker and Circuit Board Checking Method
Composite Conductive Sheet, Method for Producing the Same, Anisotropic Conductive Connector, Adapter, and Circuit Device Electric Inspection Device
Inspection Contact Structure and Probe Card
Inspection Contact Structure and Probe Card
Probe Card for Inspecting Electric Properties of an Object
Connector for Measuring Electrical Resistance, and Apparatus and Method for Measuring Electrical Resistance of Circuit Board
Anisotropically Conductive Connector Device and Inspection Apparatus for Circuit Device
Anistropic Conductive Connector, Conversion Adapter for Inspection Device Having the Anisotropic Conductive Connector, and Method for Manufacturing the Anistropic Conductive Connector
Circuit Board Apparatus for Wafer Inspection, Probe Card, and Wafer Inspection Apparatus
Anisotropically Conductive Connector and Anisotropically Conductive Connector Device
Anisotropic Conductive Connector, Probe Member and Wafer Inspection System
Electronic Part, Electronic Member Connection Method, and Circuit Connection Member
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 1, 1997
From: DOI, HIDEYUKI
To: JAPAN SYNTHETIC RUBBER CO., LTD.
Reel/Frame 008837/0716 →
Assignment of Assignor's Interest
Jul 17, 1998
From: OGURO, HISASI; INOUE, KAZUO
To: JSR CORPORATION
Reel/Frame 009313/0968 →
Assignment of Assignor's Interest
Aug 24, 1999
From: YAGII, KEIKICHI; HARUTA, YUICHI
To: JSR CORPORATION
Reel/Frame 010185/0101 →
Change of Name
Feb 18, 2000
From: JAPAN SYNTHETIC RUBBER CO., LTD.
To: JSR CORPORATION
Reel/Frame 010556/0135 →
Assignment of Assignor's Interest
Apr 20, 2000
From: SHIMODA, SUGIRO; KIMURA, KIYOSHI
To: JSR CORPORATION
Reel/Frame 010763/0403 →
Assignment of Assignor's Interest
Sep 22, 2000
From: NAOI, MASAYA
To: JSR CORPORATION
Reel/Frame 011105/0464 →
Assignment of Assignor's Interest
Feb 6, 2001
From: HARUTA, YUICHI; YASUDA, NAOSHI
To: JSR CORPORATION
Reel/Frame 011503/0833 →
Assignment of Assignor's Interest
Nov 5, 2001
From: IGARASHI, HISAO; SATO, KATSUMI
To: JSR CORPORATION
Reel/Frame 012297/0533 →
Assignment of Assignor's Interest
Nov 15, 2001
From: KIMURA, KIYOSHI; SHIMODA, SUGIRO; YASUDA, NAOSHI; YAMADA, DAISUKE
To: JSR CORPORATION
Reel/Frame 012307/0520 →
Assignment of Assignor's Interest
Nov 15, 2001
From: KOKUBO, TERUKAZU; YANADORI, NAOKI
To: JSR CORPORATION
Reel/Frame 012308/0906 →
Assignment of Assignor's Interest
Apr 10, 2003
From: IGARASHI, HISAO; INOUE, KAZUO; SETAKA, RYOJI
To: JSR CORPORATION
Reel/Frame 013945/0526 →
Assignment of Assignor's Interest
Aug 21, 2003
From: KIMURA, KIYOSHI
To: JSR CORPORATION
Reel/Frame 014412/0424 →
Assignment of Assignor's Interest
Aug 28, 2003
From: INOUE, KAZUO; IGARASHI, HISAO
To: JSR CORPORATION
Reel/Frame 014469/0647 →
Assignment of Assignor's Interest
Feb 13, 2004
From: KOKUBO, TERUKAZU; SENO, KOJI; NAOI, MASAYA; INOUE, KAZUO
To: JSR CORPORATION
Reel/Frame 014979/0148 →
Assignment of Assignor's Interest
Nov 5, 2004
From: YAMADA, DAISUKE; MAYUMI, KAZUAKI; KIMURA, KIYOSHI
To: JSR CORPORATION
Reel/Frame 015969/0481 →
Assignment of Assignor's Interest
Dec 15, 2004
From: KIMURA, KIYOSHI; KOYAMA, KEN-ICHI; HARA, FUJIO
To: JSR CORPORATION
Reel/Frame 016080/0162 →
Assignment of Assignor's Interest
Dec 15, 2004
From: SATO, KATSUMI; INOUE, KAZUO
To: JSR CORPORATION
Reel/Frame 016078/0006 →
Assignment of Assignor's Interest
Mar 22, 2005
From: SETAKA, RYOJI
To: JSR CORPORATION
Reel/Frame 016383/0791 →
Assignment of Assignor's Interest
Mar 22, 2005
From: SETAKA, RYOJI; NAOI, MASAYA; SATO, KATSUMI
To: JSR CORPORATION
Reel/Frame 016383/0788 →
Assignment of Assignor's Interest
Mar 22, 2005
From: SETAKA, RYOJI; KOKUBO, TERUKAZU; SENO, KOJI; HARA, TAKEO
To: JSR CORPORATION
Reel/Frame 016383/0785 →