Patent Assignment
Reel/Frame 017553/0124
Assignment of Assignor's Interest
Recorded: 2006-01-05
Pages: 2
Assignors
NAGATOMO, WATARI
Executed: 2005-12-12
MATSUOKA, RYOICHI
Executed: 2005-12-13
SUTANI, TAKUMICHI
Executed: 2005-12-13
SUGIYAMA, AKIYUKI
Executed: 2005-12-12
YOSHITAKE, YASUHIRO
Executed: 2005-12-12
SASAZAWA, HIDEKI
Executed: 2005-12-12
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Dimension Measuring Sem System, Method of Evaluating Shape of Circuit Pattern and a System for Carrying Out the Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.