Patent Assignment
Reel/Frame 017667/0554
Assignment of Assignor's Interest
Recorded: 2006-03-15
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Method for Detecting an Image Using the Same