Patent Assignment
Reel/Frame 017704/0108
Assignment of Assignor's Interest
Recorded: 2006-03-20
Pages: 3
Assignor
MATSUMURA, KENICHI
Executed: 2006-02-24
Assignee
ADVANCED MASK INSPECTION TECHNOLOGY INC.
1, KOMUKAI TOSHIBA-CHO, SAIWAI-KU, KAWASAKI-SHI, KANAGAWA, 212-8583, JAPAN
Covered Property
(1)
Pattern inspection apparatus and method along with workpiece tested thereby and management method of workpiece under testing
Application:
11/378,333 →
Publication:
US 2007/0146707
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.