Patent Assignment
Reel/Frame 017739/0055
Assignment of Assignor's Interest
Recorded: 2006-03-29
Pages: 3
Assignor
SERA, YOSHIAKI
Executed: 2006-03-23
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Device and Scan Test Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.