IP Library › Assignment 017787/0701
Patent Assignment
Reel/Frame 017787/0701

Assignment of Assignor's Interest

Recorded: 2006-04-12 Pages: 2
Assignors
SUTANI, TAKUMICHI
Executed: 2006-03-16
MATSUOKA, RYOICHI
Executed: 2006-03-16
MOROKUMA, HIDETOSHI
Executed: 2006-03-16
KOMURO, HITOSHI
Executed: 2006-03-16
SUGIYAMA, AKIYUKI
Executed: 2006-03-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Measuring Method and Pattern Measuring Device
Patent: 7,518,110 →
Application: 11/359,374 →
Publication: US 2006/0193508
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →