IP Library › Assignment 017790/0171
Patent Assignment
Reel/Frame 017790/0171

Assignment of Assignor's Interest

Recorded: 2006-04-14 Pages: 6
Assignor
INTEL CORPORATION
Executed: 2005-02-04
Assignee
RUDOLPH TECHNOLOGIES, INC.
ONE RUDOLPH ROAD, FLANDERS, NEW JERSEY, 07836
Covered Property (1)
Measuring Elastic Moduli of Dielectric Thin Films Using an Optical Metrology System
Patent: 7,019,845 →
Application: 10/960,351 →
Publication: US 2006/0072120
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 6, 2004
From: LEARY, SEAN P.; TAS, GURAY; MORATH, CHRISTOPHER J.; KOTELYANSKII, MICHAEL
To: RUDOLPH TECHNOLGIES, INC.
Reel/Frame 015881/0815 →
Assignment of Assignor's Interest Oct 6, 2004
From: MILLER, ANDRE D.; ANTONELLI, GEORGE A.; LUDKE, JAMIE I.
To: INTEL CORPORATION
Reel/Frame 015881/0841 →
Assignment of Assignor's Interest Apr 18, 2006
From: INTEL CORPORATION
To: RUDOLPH TECHNOLOGIES, INC.
Reel/Frame 017765/0565 →
Assignment of Assignor's Interest Jul 2, 2020
From: RUDOLPH TECHNOLOGIES, INC.
To: ONTO INNOVATION INC.
Reel/Frame 053117/0623 →