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Patent Assignment
Reel/Frame 017803/0956

Assignment of Assignor's Interest

Recorded: 2006-04-25 Pages: 2
Assignors
TASHIRO, JUNICHI
Executed: 2006-03-14
IKKU, YUTAKA
Executed: 2006-03-14
SATO, MAKOTO
Executed: 2006-03-14
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Sample Height Regulating Method, Sample Observing Method, Sample Processing Method and Charged Particle Beam Apparatus
Patent: 7,423,266 →
Application: 11/360,948 →
Publication: US 2006/0192118
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 18, 2009
From: COVELLI, JEFFREY S.
To: INNOVATIVE FIBER, LLC
Reel/Frame 023112/0510 →
Change of Name Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →