IP Library › Assignment 017819/0477
Patent Assignment
Reel/Frame 017819/0477

Assignment of Assignor's Interest

Recorded: 2006-06-19 Pages: 3
Assignors
LALLY, KEVIN
Executed: 2006-06-07
FUNK, MERRITT
Executed: 2006-06-08
SUNDARARAJAN, RADHA
Executed: 2006-06-08
Assignee
TOKYO ELECTRON LIMITED
TBS BROADCAST CENTER 3-6 AKASAKA 5-CHOME MINATO-KU, TOKYO, 107, JAPAN
Covered Property (1)
Damage Assessment of a Wafer Using Optical Metrology
Patent: 7,623,978 →
Application: 11/394,592 →
Publication: US 2007/0232045