IP Library Assignment 017841/0410
Patent Assignment
Reel/Frame 017841/0410

Assignment of Assignor's Interest

Recorded: 2006-04-28 Pages: 2
Assignors
FUKADA, ATSUKO
Executed: 2006-03-30
SATO, MITSUGU
Executed: 2006-03-30
SUZUKI, NAOMASA
Executed: 2006-03-30
NISHIYAMA, HIDETOSHI
Executed: 2006-04-07
FUKUDA, MUNEYUKI
Executed: 2006-03-31
TAKAHASHI, NORITSUGU
Executed: 2006-03-30
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Inspection Method and Inspection System Using Charged Particle Beam
Patent: 7,462,828 →
Application: 11/412,976 →
Publication: US 2006/0243906
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →