Patent Assignment
Reel/Frame 017883/0326
Assignment of Assignor's Interest
Recorded: 2006-07-06
Pages: 3
Assignee
INTERNATIONAL BUSINESS MACHINES CORPORATION
NEW ORCHARD ROAD, ARMONK, NEW YORK, 10504
Covered Property
(1)
Test Structure and Method for Detecting and Studying Crystal Lattice Dislocation Defects in Integrated Circuit Devices