Patent Assignment
Reel/Frame 017898/0288
Assignment of Assignor's Interest
Recorded: 2006-05-22
Pages: 4
Assignors
ADACHI, TATSUYA
Executed: 2006-04-05
FUJII, TOSHIAKI
Executed: 2006-04-05
IWATSUKI, MASASHI
Executed: 2006-04-05
NARUSE, MIKIO
Executed: 2006-04-05
SHEARER, MIKE HASSEL
Executed: 2006-04-05
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Tem Sample Equipped with an Identifying Function, Focused Ion Beam Device for Processing Tem Sample, and Transmission Electron Microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.