IP Library Assignment 017935/0922
Patent Assignment
Reel/Frame 017935/0922

Assignment of Assignor's Interest

Recorded: 2006-05-25 Pages: 2
Assignor
YANAGIDA, TAKAO
Executed: 2006-04-26
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Fuse Cutting Test Circuit, Fuse Cutting Test Method, and Semiconductor Circuit
Patent: 7,573,273 →
Application: 11/440,071 →
Publication: US 2006/0268485
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 4, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025311/0833 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →