Fuse cutting test circuit, fuse cutting test method, and semiconductor circuit

1. A fuse cutting test method of an electrical circuit, comprising the steps of:

a) measuring an electrical condition of the fuse via a first path and a second path to determine a configuration of the circuit, the fuse being coupled between the first and second paths while measuring the electrical condition in step a); and

b) measuring a current flowing through the fuse via a third path and a fourth path to determine the fuse to be in one of i) a completely cut state, ii) a not cut state, or iii) a partially cut state, based on the measured current value, the fuse being coupled between the third and the fourth paths while measuring the current flowing through the fuse during step b).

2. The fuse cutting test method according to claim 1 , further comprising the steps of:

determining the fuse to be in the completely cut state, when no current flows in the fuse;

determining the fuse to be in the not cut state, when the value of the current flowing through the fuse is equal to or greater than a first current value provided by a reference current source indicating that the fuse is in the not cut state; and

determining the fuse to be in the partially cut state, when the value of the current flowing through the fuse is neither of the above.

3. The fuse cutting test method according to claim 2 , wherein the first current value is substantially equal to the value of the current flowing through the fuse when, with the fuse in the not cut state, a prescribed voltage is applied across the fuse.

4. The fuse cutting test method according to claim 1 , further comprising the steps of:

determining the fuse to be in the not cut state, when the value of the current flowing through the fuse is equal to or greater than a first current value indicating that the fuse is in the not cut state;

determining the fuse to be in the completely cut state, when the value of the current flowing through the fuse is equal to or less than a second current value provided by the reference current source indicating that the fuse is in the cut state; and

determining the fuse to be in the partially cut state, when the value of the current flowing through the fuse is neither of the above.

5. The fuse cutting test method according to claim 4 , wherein the first current value is substantially equal to the value of the current flowing through the fuse when, with the fuse in the not cut state, a prescribed voltage is applied across the fuse.

6. The fuse cutting test method according to claim 4 , wherein the second current value is substantially equal to the value of the current flowing through the fuse when, with the fuse in the cut state, a prescribed voltage is applied across the fuse.

7. A semiconductor circuit, in which the state of the circuit is adjusted by cutting a fuse, comprising:

a fuse;

a first path configured to couple to a first node of the fuse;

a second path configured to couple to a second node of the fuse;

a third path configured to couple to the first node; and

a fourth path configured to couple to the second node, wherein,

the fuse is normally coupled between the first and the second paths, and uncoupled from the third and the fourth paths, in a normal mode to form a normal current path, and

the fuse is coupled between the third and the fourth paths, and uncoupled from the first and the second paths, in a test mode to form a test current path different from said normal current path.

8. The semiconductor circuit according to claim 7 , wherein,

the fuse is selectively connected to only one of the normal current path and the test current path, and

switching between the normal current path and the test current path is performed by a signal indicating that the fuse is being tested.