IP Library › Assignment 017988/0865
Patent Assignment
Reel/Frame 017988/0865

Assignment of Assignor's Interest

Recorded: 2006-06-09 Pages: 2
Assignors
HASEGAWA, MASAKI
Executed: 2006-05-25
MAKINO, HIROSHI
Executed: 2006-06-02
KOYAMA, HIKARU
Executed: 2006-05-17
CHENG, ZHAOHUI
Executed: 2006-05-17
MURAKOSHI, HISAYA
Executed: 2006-05-18
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI, 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Defect Inspection Method and Apparatus Thereof
Patent: 7,547,884 →
Application: 11/449,650 →
Publication: US 2007/0085005
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →