Patent Assignment
Reel/Frame 018025/0940
Assignment of Assignor's Interest
Recorded: 2006-06-29
Pages: 3
Assignor
CHUNG, SHINE
Executed: 2006-06-26
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
NO. 8, LI-HSIN ROAD 6, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, 300-77, TAIWAN
Covered Property
(1)
Method for Testing Memory Under Worse-Than-Normal Conditions