Patent Assignment
Reel/Frame 018027/0143
Assignment of Assignor's Interest
Recorded: 2006-06-23
Pages: 3
Assignors
OGAWA, AKIRA
Executed: 2006-04-24
USHIKU, YUKIHIRO
Executed: 2006-04-24
INO, TOMOMI
Executed: 2006-04-24
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Quality Control System, Quality Control Method, and Method of Lot-to-Lot Wafer Processing