IP Library › Assignment 018111/0133
Patent Assignment
Reel/Frame 018111/0133

Assignment of Assignor's Interest

Recorded: 2006-07-17 Pages: 2
Assignors
CHEN, HSIEN-WEI
Executed: 2006-07-13
LIN, JIAN-HONG
Executed: 2006-07-13
LEE, TZU-LI
Executed: 2006-07-14
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. 6, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, R.O.C. 300-77, TAIWAN
Covered Property (1)
Process for Improving the Reliability of Interconnect Structures and Resulting Structure
Patent: 7,816,256 →
Application: 11/487,741 →
Publication: US 2008/0014741