IP Library › Assignment 018116/0160
Patent Assignment
Reel/Frame 018116/0160

Assignment of Assignor's Interest

Recorded: 2006-07-19 Pages: 2
Assignors
KURIHARA, MASAKI
Executed: 2006-06-29
HONDA, TOSHIFUMI
Executed: 2006-06-29
NAKAGAKI, RYO
Executed: 2006-06-29
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Reviewing Defects of Semiconductor Device
Patent: 7,873,202 →
Application: 11/488,636 →
Publication: US 2007/0031026
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →