Patent Assignment
Reel/Frame 018146/0605
Assignment of Assignor's Interest
Recorded: 2006-08-01
Pages: 2
Assignee
HAMAMATSU PHOTONICS K.K.
1126-1, ICHINO-CHO, HAMAMATSU-SHI, SHIZUOKA 435-8558, JAPAN
Covered Property
(1)
Semiconductor Failure Analysis Apparatus, Failure Analysis Method, Failure Analysis Program, and Failure Analysis System