IP Library Assignment 018274/0965
Patent Assignment
Reel/Frame 018274/0965

Assignment of Assignor's Interest

Recorded: 2006-09-07 Pages: 2
Assignor
HATA, YOJI
Executed: 2003-10-20
Assignee
UMC JAPAN
1580 YAMAMOTO, TATEYAMA CITY, CHIBA 294-8502, JAPAN
Covered Property (1)
Lsi Inspection Method and Defect Inspection Data Analysis Apparatus
Patent: 7,279,923 →
Application: 11/517,046 →
Publication: US 2007/0007988
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 18, 2013
From: UMC JAPAN
To: UNITED MICROELECTRONICS CORP.
Reel/Frame 029820/0811 →