Patent Assignment
Reel/Frame 018344/0503
Assignment of Assignor's Interest
Recorded: 2006-09-25
Pages: 3
Assignor
KIM, HYUNG-MIN
Executed: 2006-09-11
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Memory Devices and Methods of Testing for Failed Bits of Semiconductor Memory Devices