IP Library › Assignment 018477/0853
Patent Assignment
Reel/Frame 018477/0853

Assignment of Assignor's Interest

Recorded: 2006-10-31 Pages: 2
Assignors
CHENG, ZHAOHUI
Executed: 2006-09-13
MAKINO, HIROSHI
Executed: 2006-09-13
KOYAMA, HIKARU
Executed: 2006-09-19
SATO, MITSUGU
Executed: 2006-09-14
Assignee
HITACHI-HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Scanning and Measurement by Electron Beam
Patent: 7,655,906 →
Application: 11/503,997 →
Publication: US 2007/0040118
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →